System for extensive harmonic analysis of rotating machinery in operation
The LMS Test.Lab 24 channel Order Analysis system provides a solution for advanced harmonic analysis on rotating equipment in operating conditions. Order sections are obtained from data sampled synchronously with rpm, giving leakage-free, razor-sharp order cuts, while additional online processing is available starting from narrowband fixed frequency sampled waterfall spectra. Raw time data can be recorded in parallel for offline processing. The data acquisition is performed using a LMS SCADAS 305 front-end with 2 tacho inputs, supporting 24 channels for ICP® and Voltage signals, including quasi-static parameters. The on-board DSP power allows data acquisition without compromises between online or offline processing. The system can optionally be configured with microphone signal conditioning and up to 60 dynamic channels plus two tacho channels can be configured in a single frame or up to 132 channels with one additional slave frame.
With the Order Tracking during Signature Acquisition workbook, the user can simultaneously acquire narrowband spectra and synchronously sampled orders during run-ups, run-downs or sequences of both, referenced to multiple physical tacho signals. Derived tacho enables online monitoring of secondary quantities, such as the rotational speed on another axis. With online derived channels, the engineer can add virtual channels by recombining the signals measured on physical channels using both basic and advanced mathematical operations. The multiple sample rates permit the amount of saved data to be reduced by acquiring vibration channels and acoustic channels at different sampling rates. Online reference curves can be used as design targets to validate the current design, or can be applied to check the repeatability of multiple runs.
The time histories for all channels can be validated immediately after the measurement and are directly written to the PC hard disc. The Signature Throughput Processing workbook provides any processing function needed to gain deeper insight into the physical processes, analyzing individual recordings or batches of time histories from multiple measurements.
